为了访问Cortex ™ -M3 TAP 对芯片进行调试,必须: 1. First, it is necessary to shift the BYPASS instruction of the boundary scan TAP. 2. Then, for each IR shift, the scan chain contains 9 bits (=5+4) and the unused TAP instruction must be shifted in using the BYPASS instruction. 3. For each data shift, the unused TAP, which is in BYPASS mode, adds 1 extra data bit in the data scan chain. Note: Important : Once Serial-Wire is selected using the dedicated ARM JTAG sequence, the boundary scan TAP is automatically disabled (JTMS forced high)。 以上该如何理解??? 现在IDCODE可以读到,但是读写有问题。 ①for each IR shift, the scan chain contains 9 bits (=5+4) and the unused TAP instruction must be shifted in using the BYPASS instruction. 该如何实现? ②For each data shift, the unused TAP, which is in BYPASS mode, adds 1 extra data bit in the data scan chain. adds 1 extra data bit是放在最后移入吗? 该如何实现正确读写? 请教大神指导指导! 是否有Demo可供参考? |
回复:STM32F10xxx JTAG TAP问题求助!
希望得到大神的指点!
RE:STM32F10xxx JTAG TAP问题求助!
RE:STM32F10xxx JTAG TAP问题求助!
RE:STM32F10xxx JTAG TAP问题求助!
RE:STM32F10xxx JTAG TAP问题求助!
RE:STM32F10xxx JTAG TAP问题求助!
STM32F10xxx微控制器内部串联了两个JTAG TAP。
TMC TAP专门用来进行测试(IR寄存器为5比特位宽)和Cortex-M3 TAP(IR寄存器为有4比特位宽)。
为了访问Cortex-M3 TAP对芯片进行调试,必须:
1.首先,必须将BYPASS指令移位输入TMC TAP。
2.其次,在移位输入IR时,每个扫描链包含9个比特位(=5+4),对于不用的TAP,必须输入BYPASS
指令
3.移位输入数据时,不用的TAP处于BYPASS模式下,因此数据扫描链需要额外添加一位比特位。
RE:STM32F10xxx JTAG TAP问题求助!
RE:STM32F10xxx JTAG TAP问题求助!
回复:STM32F10xxx JTAG TAP问题求助!